With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large number of embedded instruments became a necessity. The IEEE 1687 standard was introduced to provide flexibility in accessing and controlling such instrumentation through a reconfigurable scan chain. Nowadays, together with testing the system for defects that may affect the scan chains themselves, the diagnosis of such faults is also important. This article proposes a method for generating stimuli to precisely identify permanent high-level faults in a IEEE 1687 reconfigurable scan chain: the system is modeled as a finite state automaton where faults correspond to multiple incorrect transitions; then, a dynamic greedy algorithm is used to select a sequence of inputs able to distinguish between all possible faults. Experimental results on the widely-adopted ITC'02 and ITC'16 benchmark suites, as well as on synthetically generated circuits, clearly demonstrate the applicability and effectiveness of the proposed approach: generated sequences are two orders of magnitude shorter compared to previous methodologies, while the computational resources required remain acceptable even for larger benchmarks.

中文翻译：

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一种新的序列生成方法来诊断可重构扫描网络中的故障

随着纳米电子设备的复杂性迅速增加，处理大量嵌入式仪器的有效方法成为必要。引入 IEEE 1687 标准是为了通过可重新配置的扫描链提供访问和控制此类仪器的灵活性。如今，除了测试系统是否存在可能影响扫描链本身的缺陷外，此类故障的诊断也很重要。本文提出了一种生成刺激以精确识别 IEEE 1687 可重构扫描链中的永久性高级故障的方法：系统被建模为有限状态自动机，其中故障对应于多个不正确的转换；然后，使用动态贪婪算法来选择能够区分所有可能故障的输入序列。