In the present work we present the Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) method, a new correlative orientation imaging method for scanning electron microscopy (OIM/SEM). The RVB-EBSD method was developed to study crystal mosaicity in as-cast Ni-base superalloy single crystals (SX). The technique allows to quantify small crystallographic deviation angles between individual dendrites and to interpret associated accommodation processes in terms of geometrically necessary dislocations (GNDs). The RVB-EBSD method was inspired by previous seminal approaches which use cross correlation EBSD procedures. It applies Gaussian band pass filtering to improve the quality of more than 500 000 experimental patterns. A rotation vector approximation and a correction procedure, which relies on a base line function, are used. The method moreover features a novel way of intuitive color coding which allows to easily appreciate essential features of crystal mosaicity. The present work describes the key elements of the method and shows examples which demonstrate its potential.

中文翻译：

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由旋转矢量基线电子背散射衍射 (RVB-EBSD) 方法表征的镍基高温合金单晶 (SX) 镶嵌性

在目前的工作中，我们提出了旋转矢量基线电子背散射衍射 (RVB-EBSD) 方法，这是一种用于扫描电子显微镜 (OIM/SEM) 的新相关定向成像方法。开发了 RVB-EBSD 方法来研究铸态镍基高温合金单晶 (SX) 中的晶体镶嵌性。该技术允许量化单个树突之间的小晶体偏差角，并根据几何必要的位错 (GND) 来解释相关的调节过程。RVB-EBSD 方法的灵感来自先前使用互相关 EBSD 程序的开创性方法。它应用高斯带通滤波来提高超过 500 000 个实验模式的质量。使用依赖于基线函数的旋转矢量近似和校正程序。此外，该方法以一种新颖的直观颜色编码方式为特色，可以轻松了解晶体镶嵌的基本特征。目前的工作描述了该方法的关键要素，并展示了展示其潜力的示例。