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Design of a charged particle beam phase plate for transmission electron microscopy.
Ultramicroscopy ( IF 2.2 ) Pub Date : 2019-06-27 , DOI: 10.1016/j.ultramic.2019.06.001
Philip J B Koeck 1
Affiliation  



中文翻译:

用于透射电子显微镜的带电粒子束相位板的设计。

更新日期:2019-11-01
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