A combination of electromagnetic alignment and topological pattern assisted alignment to position magnetic nanowires, which is referred to as the Patterned Electromagnetic Alignment (PEA), is developed and examined. Electrodeposited, FeNiCo nanowires with different lengths were used as the test nanomaterial, and the microscale grooved surface was formed by UV nanoimprint lithography. The accuracy of the PEA with FeNiCo nanowires was evaluated by measuring the deviation angle from the direction of the magnetic field line for different magnetic field strengths and nanowire lengths, and a statistical alignment distribution was reported for different nanowire length groups. The results were compared with those of the electromagnetic alignment on flat surfaces and in grooved-patterned substrates without electromagnetic alignment. Overall, the deviation angle for the PEA was lower than that for the electromagnetic alignment when all other experimental conditions were identical, indicating that the alignment accuracy along the direction of the magnetic field lines was enhanced in the presence of surface micro grooves. This can be attributed to the fact that, upon attachment of nanowires to the substrate surface, the surface micro grooves in the PEA add additional deterministic characteristics to the otherwise stochastic nature of the nanowire deposition and solvent evaporation processes compared to the sole electromagnetic alignment.

中文翻译：

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磁性纳米线的图案化电磁对准

电磁对齐和拓扑图案辅助对齐的组合来定位磁性纳米线，这被称为图案化电磁对齐 (PEA)，被开发和检查。以电沉积的不同长度的FeNiCo纳米线作为测试纳米材料，通过UV纳米压印光刻形成微米级凹槽表面。通过测量不同磁场强度和纳米线长度与磁场线方向的偏差角来评估具有 FeNiCo 纳米线的 PEA 的准确性，并报告不同纳米线长度组的统计排列分布。将结果与平面上的电磁对准和没有电磁对准的凹槽图案基板的结果进行比较。全面的，在所有其他实验条件相同的情况下，PEA的偏差角小于电磁对准的偏差角，表明表面微凹槽的存在提高了沿磁场线方向的对准精度。这可以归因于这样一个事实，即在将纳米线连接到基板表面后，与单独的电磁对准相比，PEA 中的表面微槽为纳米线沉积和溶剂蒸发过程的随机性质增加了额外的确定性特征。表明在存在表面微槽的情况下，沿磁场线方向的对准精度得到了提高。这可以归因于这样一个事实，即在将纳米线连接到基板表面后，与单独的电磁对准相比，PEA 中的表面微槽为纳米线沉积和溶剂蒸发过程的随机性质增加了额外的确定性特征。表明在存在表面微槽的情况下，沿磁场线方向的对准精度得到了提高。这可以归因于这样一个事实，即在将纳米线连接到基板表面后，与单独的电磁对准相比，PEA 中的表面微槽为纳米线沉积和溶剂蒸发过程的随机性质增加了额外的确定性特征。