In this study, experimentally obtained eight-beam pinhole topographs for a silicon crystal using synchrotron X-rays were compared with computer-simulated images, and were found to be in good agreement. The experiment was performed with an asymmetric all-Laue geometry. However, the X-rays exited from both the bottom and side surfaces of the crystal. The simulations were performed using two different approaches: one was the integration of the n-beam Takagi–Taupin equation, and the second was the fast Fourier transformation of the X-ray amplitudes obtained by solving the eigenvalue problem of the n-beam Ewald–Laue theory as reported by Kohn & Khikhlukha [Acta Cryst. (2016), A72, 349–356] and Kohn [Acta Cryst. (2017), A73, 30–38].

中文翻译：

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硅晶体的实验获得和计算机模拟 X 射线不对称八束针孔形貌图

在这项研究中，使用同步加速器 X 射线实验获得的硅晶体八束针孔形貌图与计算机模拟图像进行了比较，结果发现两者吻合良好。该实验是使用不对称的全劳厄几何结构进行的。然而，X 射线从晶体的底面和侧面射出。使用两种不同的方法进行模拟：一种是集成n-beam Takagi-Taupin 方程，第二个是通过求解特征值问题得到的 X 射线振幅的快速傅立叶变换nKohn 和 Khikhlukha 报道的 -beam Ewald-Laue 理论 [水晶学报。（2016），A72，349–356]和科恩[阿克塔水晶。（2017），A73，30-38]。