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Resonant charge transfer in low-energy ion scattering: Information depth in the reionization regime
Surface Science ( IF 1.9 ) Pub Date : 2011-11-01 , DOI: 10.1016/j.susc.2011.07.006 D Primetzhofer 1 , M Spitz , E Taglauer , P Bauer
Surface Science ( IF 1.9 ) Pub Date : 2011-11-01 , DOI: 10.1016/j.susc.2011.07.006 D Primetzhofer 1 , M Spitz , E Taglauer , P Bauer
Affiliation
Time-Of-Flight Low-energy ion scattering (TOF-LEIS) experiments were performed for He+ ions scattered from Cu(100) and Cu0.5Au0.5(100). Probabilities for resonant neutralization and reionization in close collisions were deduced in a wide energy range. To learn about the information depth in LEIS, in a next step ion spectra were analyzed for polycrystalline Cu samples. The relative yield of backscattered projectiles, which have undergone distinct charge exchange processes, was calculated. Results indicate a strong contribution to the ion yield that origins from particles reionized in a close collision in deeper layers when experiments are performed at energies where reionization is prominent. The surface sensitivity of the ion signal at different energies is quantified. Based on these results, the total ion spectrum was quantitatively modelled by two consistent, but different approaches.
更新日期：2011-11-01
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