X-ray diffraction imaging is rapidly emerging as a powerful technique by which one can capture the local structure of crystalline materials at the nano- and meso-scale. Here, we present investigations of the dynamic structure of epitaxial monodomain BiFeO3 thin-films using a novel full-field Bragg diffraction imaging modality. By taking advantage of the depth penetration of hard X-rays and their exquisite sensitivity to the atomic structure, we imaged in situ and in operando, the electric field-driven structural responses of buried BiFeO3 epitaxial thin-films in micro-capacitor devices, with sub-100 nm lateral resolution. These imaging investigations were carried out at acquisition frame rates that reached up to 20 Hz and data transfer rates of 40 MB/s, while accessing diffraction contrast that is sensitive to the entire three-dimensional unit cell configuration. We mined these large datasets for material responses by employing matrix decomposition techniques, such as independent component analysis. We found that this statistical approach allows the extraction of the salient physical properties of the ferroelectric response of the material, such as coercive fields and transient spatiotemporal modulations in their piezoelectric response, and also facilitates their decoupling from extrinsic sources that are instrument specific.

中文翻译：

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铋铁氧体中铁电响应的动态X射线衍射成像。

X射线衍射成像正迅速成为一种强大的技术，通过它可以捕获纳米和中观尺度的晶体材料的局部结构。在这里，我们目前使用新型的全场布拉格衍射成像方式对外延单畴BiFeO3薄膜的动态结构进行研究。通过利用硬X射线的深度穿透及其对原子结构的灵敏性，我们在原位和操作中对微电容器器件中埋藏的BiFeO3外延薄膜的电场驱动结构响应进行了成像，低于100 nm的横向分辨率。这些成像研究是以高达20 Hz的采集帧速率和40 MB / s的数据传输速率进行的，同时访问对整个三维晶胞配置敏感的衍射对比。我们通过采用矩阵分解技术（例如独立成分分析）来挖掘这些大型数据集的材料响应。我们发现，这种统计方法可以提取材料的铁电响应的显着物理特性，例如矫顽场和压电响应中的瞬态时空调制，还可以促进它们与特定于仪器的外部源解耦。