Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor f that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with f 4 compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate.

中文翻译：

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用于扫描透射电子显微镜的快速图像仿真算法。

对于具有实际尺寸的样品，以原子分辨率扫描透射电子显微镜的图像模拟可能需要使用现有的模拟算法进行大量计算。我们提出了一种新的名为PRISM的算法，该算法结合了两种最常用算法的特性，即Bloch波和多层方法。PRISM使用傅立叶插值因子f进行原子分辨率模拟，其典型值为4-20。我们表明，在许多情况下，与多层仿真相比，PRISM可以提供以f 4缩放的加速比，而精度损失可忽略不计。我们用非晶碳基底上的晶体纳米粒子的大规模扫描透射电子显微镜图像模拟证明了该方法的有效性。