The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electronsas probes or detected particles in the investigation.

The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.

The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.

Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis

Editors
W. Eberhardt
Inst. für Optik und Atomare Physik, Technische Universität Berlin (TUB), Straße des 17. Juni 135, 10623, Berlin, Germany Phone +49 (030) 314 29174 Email W. Eberhardt
A.P. Hitchcock
Brockhouse Institute for Materials Research (BIMR) and Department of Chemistry and Chemical Biology, McMaster University, 1280 Main St., Hamilton, L8S 4M1, Ontario, Canada, Fax: +1-905-5212773 Email A.P. Hitchcock
N. Kosugi
Inst. for Molecular Science (IMS), National Institutes of Natural Sciences, Nishigo-Naka 38, Myodaiji, 444-8585, Okazaki, Japan, Fax: +81-564-54-2254 Phone +81 564-55-7390Email N. Kosugi
Honorary Board
C.R. Brundle
California, USA
G.E. McGuire
Research Triangle Park, North Carolina, USA
T. Ohta
Shiga, Japan
J.-J. Pireaux
Namur, Belgium
Editorial Board
H.W. Ade
North Carolina State University, Raleigh, North Carolina, USA
P.S. Bagus
University of North Texas, Denton, Texas, USA
H. Daimon
Nara Institute of Science and Technology, Ikoma Nara, Japan
F.M.F. de Groot
Universiteit Utrecht, Utrecht, Netherlands
H. Ebert
Ludwig-Maximilians-Universität München (LMU), Munich, Germany
C.S. Fadley
Lawrence Berkeley National Laboratory, Berkeley, California, USA
D.L. Feng
Fudan University, Shanghai, China
X. Gao
Chinese Academy of Sciences (CAS), Shanghai, China
M. Grioni
École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland
U. Hergenhahn
Max Planck Institut (MPI) für Plasmaphysik, Greifswald, Germany
D.-J. Huang
National Synchrotron Radiation Reserach Center (NSRRC), , Hsinchu, Taiwan
S. Kera
Institute for Molecular Science, Okazaki, Japan
A. Kimura
Hiroshima University, Higashi-Hiroshima, Japan
K.T. Leung
University of Waterloo, Waterloo, Ontario, Canada
C. Miron
Synchrotron Soleil, Gif-sur-Yvette Cedex, France
S. Molodtsov
European X-ray Free Electron Laser (XFEL), Hamburg, Germany
A. Naves de Brito
Universidade Estadual de Campinas (UNICAMP), Campinas, Brazil
D. Prendergast
Lawrence Berkeley National Laboratory, Berkeley, California, USA
D.D. Sarma
Indian Institute of Science, Bangalore, India
T. Schmitt
Paul Scherrer Institut (PSI), Villigen, Switzerland
S. Suzer
Bilkent University, Ankara, Turkey
M. Vos
Australian National University, Canberra, Australian Capital Territory, Australia
P. Weightman
University of Liverpool, Liverpool, UK
W. Werner
Technische Universität Wien, Vienna, Austria
H.W. Yeom
Pohang University of Science and Technology, Nam-gu, Pohang, The Republic of Korea
M. Zharnikov
Ruprecht-Karls-Universität Heidelberg, Heidelberg, Germany