Editor-in-Chief Xuemin (Sherman) Shen, University of Waterloo, Canada xshen@bbcr.uwaterloo.ca Associate Editors Nikos Antonopoulos, University of Derby, UK Jiannong Cao, Hong Kong Polytechnic University, China Shan Chang, Donghua University, China Nan Cheng, Xidian University, China
Francesco Chiti, Università degli Studi di Firenze, Italy
Sajal Das, University Texas at Arlington, USA
Yong Ding, Guilin University of Electronic Technology, China
Khalid Elgazzar, University of Ontario Institute of Technology, Canada Nelson L. S. da Fonseca, State University of Campinas, Brazil Khaled Hatem Almotairi, Umm Al-Qura University, Saudi Arabia Peter Langendoerfer, IHP Microelectronics, Germany Hongwei Li, University of Electronic Science and Technology of China, China Lu Liu, University of Derby, UK Rongxing Lu, Nanyang Technological University, Singapore Mohamed M. E. A. Mahmoud, Tennessee Tech University, USA Vojislav B. Misic, University of Manitoba, Canada Kaoru Ota, Muroran Institute of Technology, Japan
Benedetta Picano, Università degli Studi di Firenze, Italy
Wei Quan, Beijing Jiaotong University, China Ju Ren, Central South University, China Mi Wen, Shanghai University of Electric Power, China
Kuan Zhang, University of Nebraska-Lincoln, USA Yongbing Zhang, University of Tsukuba, Japan Haojin Zhu, Shanghai Jiao Tong University, China
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