Pattern Recognition Letters aims at rapid publication of concise articles of a broad interest in pattern recognition.
Subject areas include all the current fields of interest represented by the Technical Committees of the International Association of Pattern Recognition, and other developing themes involving learning and recognition. Examples include: 

• Statistical, structural, syntactic pattern recognition; 
• Neural networks, machine learning, data mining; 
• Discrete geometry, algebraic, graph-based techniques for pattern recognition; 
• Signal analysis, image coding and processing, shape and texture analysis; 
• Computer vision, robotics, remote sensing; 
• Document processing, text and graphics recognition, digital libraries; 
• Speech recognition, music analysis, multimedia systems; 
• Natural language analysis, information retrieval; 
• Biometrics, biomedical pattern analysis and information systems; 
• Special hardware architectures, software packages for pattern recognition. 

We invite contributions as research reports or commentaries. 

Research reports should be concise summaries of methodological inventions and findings, with strong potential of wide applications.
Alternatively, they can describe significant and novel applications of an established technique that are of high reference value to the same application area and other similar areas. 

Commentaries can be lecture notes, subject reviews, reports on a conference, or debates on critical issues that are of wide interests. 

To serve the interests of a diverse readership, the introduction should provide a concise summary of the background of the work in an accepted terminology in pattern recognition, state the unique contributions, and discuss broader impacts of the work outside the immediate subject area. All contributions are reviewed on the basis of scientific merits and breadth of potential interests.

 research reports or commentaries

Editors-in-Chief
M. De Marsico
University of Rome La Sapienza Department of Computer Science, Rome, Italy
J. Lu
Tsinghua University, Beijing, China
G. Sanniti di Baja
Institute for High Performance Computing and Networking National Research Council, Rende, Italy
S. Sarkar
University of South Florida, Tampa, Florida, United States
Managing Editor
F. Malmberg
Uppsala University, Uppsala, Sweden
Area Editors
E.L. van den Broek
Utrecht University, Utrecht, Netherlands
E.R. Davies
Royal Holloway University of London Department of Physics, Egham, United Kingdom
A. Kumar
The Hong Kong Polytechnic University Faculty of Engineering Department of Computing, Kowloon, Hong Kong
Y. Liu
Edge Hill University Department of Computing, Ormskirk, United Kingdom
Associate Editors
G. Azzopardi
University of Groningen, Bernoulli Institute for Mathematics, Computer Science and Artificial Intelligence, Groningen, Netherlands
X. Bai
Huazhong University of Science and Technology, Wuhan, China
E. Benetos
Queen Mary University of London, London, United Kingdom
M. Castrillon Santana
University of Las Palmas de Gran Canaria School of Engineering, Las Palmas de Gran Canaria, Spain
S. Chen
Nanjing University of Aeronautics and Astronautics, Nanjing, China
A. S. Chowdhury
Jadavpur University, Kolkata, India
M. Cristani
University of Verona Department of Computer Science, Verona, Italy
M. Crocco
Italian Institute of Technology, Genova, Italy
D. Dembélé
Institut of Genetics and Molecular and Cellular Biology, Illkirch Graffenstaden, France
S. Dutta Roy
Indian Institute of Technology Delhi, New Delhi, India
A. Fernández-Caballero
University of Castilla-La Mancha Albacete Research Institute of Informatics, Albacete, Spain
J. Han
Northwestern Polytechnical University, Xian, China
L. Heutte
University of Rouen Laboratory of Computer Science Information Processing and Systems, Saint-Etienne-du-Rouvray, France
L. Jin
South China University of Technology, Guangzhou, China
J.K. Kamarainen
LUT University, LAPPEENRANTA, Finland
V. Kovalev
National Academy of Sciences of Belarus, Minsk, Belarus
S. Kumar
X. Liu
Michigan State University, East Lansing, Michigan, United States
B. Luo
Anhui University, Hefei, China
A. Marcelli
University of Salerno, Fisciano, Italy
E. Michaelsen
Fraunhofer Institute of Optronics System Technologies and Image Exploitation IOSB Ettlingen Branch, Ettlingen, Germany
M. Nappi
University of Salerno, Fisciano, Italy
U. Pal
Indian Statistical Institute Computer Vision and Pattern Recognition Unit, Kolkata, India
Y. Peng
Peking University, Beijing, China
X. Qian
Texas A&M University College Station, College Station, Texas, United States
J. Ruiz-Shulcloper
Advanced Technologies Application Centre, La Habana, Cuba
P.K. Saha
University of Iowa, Iowa City, Iowa, United States
S. Shan
Chinese Academy of Sciences, Beijing, China
A. Shokoufandeh
Drexel University College of Computer and Informatics, Philadelphia, Pennsylvania, United States
R. D Silva Torres
State University of Campinas, Campinas, São Paulo, Brazil
A. C. Telea
Utrecht University, Utrecht, Netherlands
S. Todorovic
Oregon State University School of Electrical Engineering and Computer Science, Corvallis, Oregon, United States
K.A. Toh
Yonsei University, Seoul, Korea, Republic of
A. Torsello
Ca' Foscari University Department of Environmental Sciences Informatics and Statistics, Venezia, Italy
F. Tortorella
University of Salerno, Fisciano, Italy
S. Wang
University of South Carolina, Columbia, South Carolina, United States
H. Yan
Beijing University of Posts and Telecommunications, Beijing, China
J. Yang
Nanjing University of Science and Technology, Nanjing, China
L. Yin
Binghamton University, Binghamton, New York, United States
J. Zou
National Library of Medicine, Bethesda, Maryland, United States
Advisory Editors
S. Dickinson
University of Toronto, Toronto, Ontario, Canada
R.P.W. Duin
TU Delft, Delft, Netherlands
J.V. Kittler
University of Surrey, Guildford, United Kingdom
W.G. Kropatsch
TU Wien University, Wien, Austria
Mark S. Nixon
University of Southampton, Southampton, United Kingdom
T. Tan
National Laboratory of Pattern Recognition, Beijing, China
Founding Editors
E. Backer
E.S. Gelsema
Editor Emeriti
G. Borgefors
Uppsala University, Uppsala, Sweden
T.K. Ho
Nokia Bell Labs, Murray Hill, New Jersey, United States