A specific delayed ion extraction (DIE) technique, which combines a standard rectangular extraction pulse with an exponential pulse, was introduced for a single particle mass spectrometry (SPMS) instrument, and it can focus ions in a wide mass range and results in a mass resolution improvement for the mass range of the studied ions. The experimental results indicate that the average mass resolution for positive ions is about 1000 when the mass-to-charge ratio (m/z) is greater than 70, and for negative ions, when the m/z is greater than 70, the average resolution can reach 2000. The highest mass resolutions achieved so far are 1260 for positive ions and 2400 for negative ions for SPMS, which are very beneficial for mass peak interpretation and chemical compound identification. The primary applications for atmospheric particle measurements show that the high mass resolution of SPMS with the DIE technique is very beneficial for the analysis of carbon and metallic element containing particles, and ³⁹K⁺ with C₃H₃⁺ and ⁴¹K⁺ and C₃H₅⁺ in organic particles were successfully differentiated using SPMS. The results indicate that SPMS with DIE technique can significantly ease mass peak interpretation and improve the mass assignment ability during analysis. Furthermore, existing SPMS instruments can be improved by a facile retrofitting process to implement the DIE technique.

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针对单颗粒质谱（SPMS）仪器，引入了将标准矩形提取脉冲与指数脉冲相结合的特定延迟离子提取（DIE）技术，该技术可以将离子聚焦在较宽的质量范围内并产生质量数改善了所研究离子的质量范围。实验结果表明，对于正离子的平均质量分辨率为约1000，当质荷比（米/ Ž）是大于70，和用于负离子，当米/ ž大于70时，平均分辨率可以达到2000。迄今为止，对于SPMS，正离子的最高质量分辨率为1260，负离子的最高质量分辨率为2400，这对于质量峰解释和化合物鉴定非常有用。大气颗粒测量的主要应用表明，采用DIE技术进行SPMS的高质量分离对于分析含碳和金属元素的颗粒以及³⁹ K ⁺和C ₃ H ₃ ⁺以及⁴¹ K ⁺和C _3的颗粒非常有用。高₅ ⁺使用SPMS成功区分了有机颗粒中的有机物。结果表明，采用DIE技术的SPMS可以大大简化质谱峰的解释，并提高分析过程中的质量分配能力。此外，现有的SPMS仪器可通过实施DIE技术的便捷改装过程加以改进。

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