X-ray ptychography is becoming the standard method for sub-30 nm imaging of thick extended samples. Available algorithms and computing power have traditionally restricted sample reconstruction to 2D slices. We build on recent progress in optimization algorithms and high-performance computing to solve the ptychographic phase retrieval problem directly in 3D. Our approach addresses samples that do not fit entirely within the depth of focus of the imaging system. Such samples pose additional challenges because of internal diffraction effects within the sample. We demonstrate our approach on a computational sample modeled with 17 million complex variables.

中文翻译：

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对超出焦深限制的连续物体进行 3D X 射线成像

X 射线叠层成像技术正在成为厚扩展样品的 30 nm 以下成像的标准方法。传统上，可用的算法和计算能力将样本重建限制为二维切片。我们基于优化算法和高性能计算方面的最新进展，直接以 3D 方式解决叠印相位检索问题。我们的方法解决了不完全适合成像系统焦深的样本。由于样品内部的衍射效应，此类样品带来了额外的挑战。我们在使用 1700 万个复杂变量建模的计算样本上展示了我们的方法。