This work investigates long‐term photoelectrochemical hydrogen evolution (82 days) in 1 M HClO₄ using a TiO₂:H protected crystalline Si‐based photocathode with metal‐oxide‐semiconductor (MOS) junctions. It is shown that day/night cycling leads to relatively rapid performance degradation while the photocurrent under the continuous light condition is relatively stable. We observed that the performance loss is mainly due to contamination of the catalytically active surface with carbonaceous material. By ultraviolet (UV) light exposure, we also observed that the activity can be restored, most likely due to photocatalytic degradation of organic compounds by the UV light excited TiO₂ protection layer.

中文翻译：

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日/夜光循环条件下光电化学制氢的耐久性测试

这项工作使用具有金属氧化物半导体（MOS）结的TiO ₂：H保护的晶体硅基光电阴极，研究了在1 M HClO ₄中长期的光电化学氢析出（82天）。结果表明，昼夜循环导致相对快速的性能下降，而在连续光照条件下的光电流则相对稳定。我们观察到性能损失主要是由于含碳材料污染了催化活性表面。通过紫外线照射，我们还观察到可以恢复活性，这很可能是由于紫外线激发的TiO ₂保护层对有机化合物的光催化降解。