Cu/Nb nanoscale metallic multilayers have been extensively investigated to understand how their mechanical behavior is influenced by the individual layer thickness. The general observed trend is that the yield stress of the multilayer increases with decreasing layer thickness. Important mechanical behaviors that have not been studied in-depth are the fracture of these multilayers and adhesion energy between the multilayer films and their substrate. Here, the influences of the layer thickness, layer order, and initial residual stresses of Cu/Nb multilayers on polyimide were examined using in-situ x-ray diffraction and confocal laser scanning microscopy under tensile loading. With these techniques, it was possible to calculate the stresses developing in the individual materials and measure buckles that could be used to evaluate the interfacial adhesion. Layer thickness, deposition order, and the initial residual stresses were not shown to influence the initial fracture strains of the Cu/Nb multilayer systems under tensile loading conditions. However, the adhesion energy between the multilayer and substrate was affected by the layer deposition order and by the initial residual stresses.

Cu / Nb纳米级金属多层膜已被广泛研究，以了解其机械行为如何受到各个层厚度的影响。通常观察到的趋势是，多层的屈服应力随着层厚度的减小而增加。尚未深入研究的重要机械行为是这些多层的断裂以及多层膜与其基材之间的粘附能。在这里，使用原位X射线衍射和共聚焦激光扫描显微镜在拉伸载荷下检查了Cu / Nb多层的层厚度，层顺序和初始残余应力对聚酰亚胺的影响。有了这些技巧，可以计算出每种材料中产生的应力，并测量可用于评估界面附着力的弯曲度。没有显示层厚度，沉积顺序和初始残余应力会影响在拉伸载荷条件下Cu / Nb多层系统的初始断裂应变。然而，多层与基底之间的粘合能受层沉积顺序和初始残余应力的影响。