Phase retrieval is an important tool to unveil wavefront of light, especially in high performance microscopy such as Fourier ptychographic microscopy (FPM). In general phase-retrieval methods, the resolution and the number of measurements are in a trade-off relationship. Inspired by FPM, we devise what we believe is a novel microscopic phase-retrieval method, termed single-shot FPM (SSFPM). In our approach, the imaging performance exceeds the trade-off relationship in that it enables phase retrieval for high resolution with a single measurement. By placing the lens array at the Fourier plane of the objective lens, multiple intensity profiles required for the FPM algorithm are collected in a single shot. To achieve enough redundancy of data for satisfying convergence condition of FPM, the specimen is simultaneously illuminated by multiple light-emitting diodes. SSFPM reconstructs quantitative phase profile and enhances the resolution sacrificed by applying lens-array imaging. We demonstrate the performance of SSFPM with numerical simulation and experiments. The prototype achieves lateral resolution of 3.10 μm over a field of view of $0.34{\mathrm{mm}}^2$. Without an interferometer or scanning devices, SSFPM can reconstruct high resolution of a complex profile with a single shot.

中文翻译：

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通过傅里叶相谱显微镜单次取相

相位恢复是揭示光波前的重要工具，尤其是在诸如傅里叶液相色谱（FPM）的高性能显微镜中。在一般的相位检索方法中，分辨率和测量次数处于权衡关系中。受FPM启发，我们设计了一种新颖的微观相位检索方法，称为单次FPM（SSFPM）。在我们的方法中，成像性能超出了权衡关系，因为它可以通过一次测量就可以实现高分辨率的相位恢复。通过将透镜阵列放置在物镜的傅里叶平面上，可以一次拍摄FPM算法所需的多个强度分布。为了实现足够的数据冗余以满足FPM的收敛条件，样品同时被多个发光二极管照亮。SSFPM可重建定量相图并提高通过应用透镜阵列成像牺牲的分辨率。我们通过数值模拟和实验证明了SSFPM的性能。该原型在3D的视野范围内实现了3.10μm的横向分辨率$0.34{\mathrm{毫米}}^{\mathrm{2个}}$。在没有干涉仪或扫描设备的情况下，SSFPM可以一次拍摄即可重建复杂轮廓的高分辨率。