Polymers with a perylenediimide (PDI) side chain (PAc12PDI) consist of two kinds of crystalline structures with various types of orientations in a thin film. Understanding the population of the microcrystalline structure and its orientation along the thickness is strongly desired. Grazing-incidence wide-angle X-ray diffraction (GIWAXD) measurements with hard X-rays, which are generally chosen as λ = 0.1 nm, are a powerful tool to evaluate the molecular aggregation structure in thin films. A depth-resolved analysis for the outermost surface of the polymeric materials using conventional GIWAXD measurements, however, has limitations on depth resolution because the X-ray penetration depth dramatically increases above the critical angle. Meanwhile, tender X-rays (λ = 0.5 nm) have the potential advantage that the penetration depth gradually increases above the critical angle, leading to precise characterization for the population of crystallite distribution along the thickness. The population of the microcrystalline states in the PAc12PDI thin film was precisely characterized utilizing GIWAXD measurements using tender X-rays. The outermost surface of the PAc12PDI thin film is occupied by a monoclinic lattice with a = 2.38 nm, b = 0.74 nm, c = 5.98 nm, and β = 108.13°, while maintaining the c-axis perpendicular to the substrate surface. Additionally, the presence of solid substrate controls the formation of the crystallite with unidirectional orientation.

中文翻译：

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入射角广角X射线衍射与嫩X射线对of二酰亚胺侧链聚合物薄膜结构的深度分辨表征

具有a二酰亚胺（PDI）侧链（PAc12PDI）的聚合物由两种具有各种取向的薄膜晶体结构组成。强烈希望了解微晶结构的总体及其沿厚度的取向。硬X射线的掠入射广角X射线衍射（GIWAXD）测量通常选择为λ= 0.1 nm，是评估薄膜中分子聚集结构的有力工具。但是，使用常规GIWAXD测量技术对聚合物材料的最外表面进行深度解析分析会限制深度分辨率，因为X射线穿透深度会急剧增加到临界角以上。同时，发出柔和的X射线（λ= 0。5nm）具有潜在的优点，即穿透深度在临界角以上逐渐增加，从而导致对沿厚度分布的微晶分布群的精确表征。通过使用嫩X射线的GIWAXD测量，可以精确地表征PAc12PDI薄膜中微晶态的数量。PAc12PDI薄膜的最外表面被单斜晶格占据，a = 2.38 nm，b = 0.74 nm，c = 5.98 nm，β= 108.13°，同时保持c轴垂直于基板表面。另外，固体基质的存在控制了具有单向取向的微晶的形成。