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Effects of chemical etching on structure and properties of Y 0.5 Gd 0.5 Ba 2 Cu 3 O 7-z coated conductors
Ceramics International ( IF 5.2 ) Pub Date : 2018-09-01 , DOI: 10.1016/j.ceramint.2018.05.221
M.J. Wang , W.T. Wang , L. Liu , F. Scurti , Y.D. Xia , B.L. Huo , X. Yang , Y. Zhao

Abstract Corrosion resistance is a crucial property to achieve successful superconducting joints of Y0.5Gd0.5Ba2Cu3O7-z (YGdBCO) coated conductors (CCs). Cu and Ag metallic layers need to be fully removed from the area of conductor to be joint to allow for a superconducting path across the joint. Therefore, when using a wet etching process to remove the metallic layers, the joint performance can be significantly influenced by the etching conditions. The effects of chemical etching with ammonia water and hydrogen peroxide mixture on crystal structure, surface microstructure and critical current (Ic) of YGdBCO CCs were systematically investigated. We found the set of etching parameters that does not affect conductor performance, leaving the Ic of the YGdBCO conductor unchanged upon etching. However, when the etching conditions are not optimal, decrease in Ic was found and the underlying reasons driving the degradation were investigated. Raman spectroscopy and XRD analysis indicated that the reduced Ic is mainly due to oxygen deficiency in the YGdBCO crystal lattice.

中文翻译:

化学蚀刻对Y 0.5 Gd 0.5 Ba 2 Cu 3 O 7-z涂层导体结构和性能的影响

摘要 耐腐蚀性是实现 Y0.5Gd0.5Ba2Cu3O7-z (YGdBCO) 涂层导体 (CCs) 成功超导接头的关键特性。Cu 和 Ag 金属层需要从要连接的导体区域完全去除,以允许跨越接头的超导路径。因此,当使用湿蚀刻工艺去除金属层时,蚀刻条件会显着影响接头性能。系统地研究了氨水和过氧化氢混合物化学蚀刻对 YGdBCO CC 的晶体结构、表面微观结构和临界电流 (Ic) 的影响。我们发现一组不影响导体性能的蚀刻参数,在蚀刻时保持 YGdBCO 导体的 Ic 不变。然而,当蚀刻条件不是最佳时,发现 Ic 降低,并调查了导致降解的根本原因。拉曼光谱和 XRD 分析表明,减少的 Ic 主要是由于 YGdBCO 晶格中的氧缺乏所致。
更新日期:2018-09-01
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