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Specific Domain Pattern of ε-Fe2O3 Thin Films Grown on Yttrium-Stabilized Zirconia (100) as a Nucleation Site for α-Fe2O3
Crystal Growth & Design ( IF 3.8 ) Pub Date : 2018-05-04 00:00:00 , DOI: 10.1021/acs.cgd.8b00338
Vu Quoc Viet , Salawu Yusuff Adeyemi , Won Huyk Son 1 , Jong-Soo Rhyee 1 , Nam-Suk Lee 2 , Heon-Jung Kim
Affiliation  

This study examined the phase competition and critical thickness of ε-Fe2O3 in epitaxial ε-Fe2O3 thin films grown on a (100)-oriented yttrium-stabilized zirconia (YSZ) substrate using a pulsed laser deposition technique. The maximum critical thickness was found to be ∼20 nm for a single phase of ε-Fe2O3 at the optimal laser spot size without impurities. Above this critical thickness, (00l)-oriented α-Fe2O3 begins to appear along with ε-Fe2O3, eventually dominating in the thicker samples. These results suggest that the stability of ε-Fe2O3 films are influenced by the appearance of a specific domain pattern, which becomes a favorable nucleation site for α-Fe2O3. The ε-Fe2O3 films grown on the YSZ (100) substrate have a larger saturation moment than ε-Fe2O3 grown on SrTiO3 (111), and its coercive field approaches 1/4 of the maximum coercive field of ε-Fe2O3 nanoparticles.

中文翻译:

的特定磁畴图案ε -铁2 ö 3层上生长的钇稳定的氧化锆(100),其为成核位点用于薄膜的α-Fe 2 ö 3

本研究ε-Fe的相竞争和临界厚度2 ö 3在外延ε -铁2 ö 3个薄膜生长使用脉冲激光沉积技术(100)取向的钇稳定的氧化锆(YSZ)衬底上。最大临界厚度被发现是对ε-Fe的单相〜20纳米2 ö 3在最佳激光光斑大小无杂质。高于该临界厚度,(00升)取向的α-Fe 2 ö 3开始与ε -铁一起出现2 ö 3,最终较厚样品中主导。这些结果表明,稳定ε -铁2 ö 3薄膜是由特定域图案的外观,这成为了良好的成核位点用于的α-Fe的影响2 ö 3。的ε -铁2个ö 3个薄膜生长在YSZ(100)衬底具有较大的饱和磁矩比ε -铁2 ö 3上的SrTiO生长3(111),它的矫顽场接近1/4的最大矫顽场的ε -铁2个ö 3纳米颗粒。
更新日期:2018-05-04
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