We report the structural evolution of reduced graphene oxide (rGO) in graphene oxide (GO) flakes during 1 MeV Si+ ion irradiation. In-situ electrical resistivity measurements facilitate monitoring the sheet resistance with the increase in the fluence. The electrical sheet resistance of the GO flake shows the exponential decay behaviour with the increasing ion fluence. Raman spectra of the GO flake reveal the increase in the ID/IG ratio, indicating restoration of the sp2 network upon irradiation. The C/O ratio estimated from resonant Rutherford backscattering spectrometry analysis directly evidenced the reduction of oxygen moieties upon irradiation. C K–edge X-ray absorption near edge structure spectra reveal the restoration of C=C sp2–hybridized carbon atoms and the removal of oxygen-containing functional groups in the GO flake. STM data reveal the higher conductance in the rGO regime in comparison with the regime, where the oxygen functional groups are present. The experimental investigation demonstrates...

中文翻译：

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离子辐照期间氧化石墨烯中还原氧化石墨烯的结构评估：X 射线吸收光谱和原位薄层电阻研究

我们报告了在 1 MeV Si+ 离子辐照期间氧化石墨烯 (GO) 薄片中还原氧化石墨烯 (rGO) 的结构演变。原位电阻率测量有助于监测随着通量增加的薄层电阻。随着离子注量的增加，GO 薄片的薄层电阻显示出指数衰减行为。GO 薄片的拉曼光谱显示 ID/IG 比率增加，表明 sp2 网络在辐照后恢复。从共振卢瑟福背散射光谱分析估计的 C/O 比直接证明辐照后氧部分的减少。CK-edge X 射线吸收近边结构光谱揭示了 C=C sp2-杂化碳原子的恢复和 GO 薄片中含氧官能团的去除。STM 数据显示，与存在氧官能团的区域相比，rGO 区域的电导率更高。实验调查表明...