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Dislocation structure in textured zirconium tensile-deformed along rolling and transverse directions determined by X-ray diffraction line profile analysis
Journal of Nuclear Materials ( IF 3.1 ) Pub Date : 2018-02-20 , DOI: 10.1016/j.jnucmat.2018.02.026
Zhijian Fan , Bertalan Jóni , Lei Xie , Gábor Ribárik , Tamás Ungár

Specimens of cold-rolled zirconium were tensile-deformed along the rolling (RD) and the transverse (TD) directions. The stress-strain curves revealed a strong texture dependence. High resolution X-ray line profile analysis was used to determine the prevailing active slip-systems in the specimens with different textures. The reflections in the X-ray diffraction patterns were separated into two groups. One group corresponds to the major and the other group to the random texture component, respectively. The dislocation densities, the subgrain size and the prevailing active slip-systems were evaluated by using the convolutional multiple whole profile (CMWP) procedure. These microstructure parameters were evaluated separately in the two groups of reflections corresponding to the two different texture components. Significant differences were found in both, the evolution of dislocation densities and the development of the fractions of <a> and <c+a> type slip systems in the RD and TD specimens during tensile deformation. The differences between the RD and TD stress-strain curves are discussed in terms of the differences of the microstructure evolution.



中文翻译:

X射线衍射线轮廓分析确定的沿轧制和横向拉伸变形的织构锆中的位错结构

冷轧锆试样沿轧制(RD)和横向(TD)方向拉伸变形。应力-应变曲线显示出强烈的纹理依赖性。高分辨率X射线线轮廓分析用于确定具有不同纹理的标本中的主要活性滑移系统。X射线衍射图中的反射被分成两组。一组分别对应于主纹理,另一组对应于随机纹理分量。通过使用卷积多重整体轮廓(CMWP)程序评估了位错密度,亚晶粒尺寸和主要的活动滑移系统。在对应于两个不同纹理成分的两组反射中分别评估了这些微结构参数。在拉伸变形过程中,RD和TD样品中的a >和< c + a >型滑移系统。讨论了RD和TD应力-应变曲线之间的差异,探讨了微观组织演变的差异。

更新日期:2018-02-20
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