This work investigates in detail the reliability of poly(2,7‐carbazole‐alt‐4, 7‐dithienyl‐2,1,3‐benzothiadiazole):phenyl‐C61‐butyric acid methyl ester‐based organic photodiodes (OPDs) under visible light and air exposure. The current–voltage (I–V) characteristics of the state‐of‐the‐art OPDs are measured both at room and low temperature, before, during, and after ageing. While electrodes are only slightly impacted by ageing, the active layer is significantly damaged regardless the absence of UV light, leading to a major decrease in the responsivity. The combination of the thermally stimulated current and the I–V characteristics versus temperature (I–V–T) techniques along with the extensive use of the drift‐diffusion simulations all reveals that the observed degradation is the consequence of the generation of shallow traps (0.2 eV, N_T = 10¹⁶ cm⁻³) that significantly reduce the charge carrier mobility. In contrast, deep traps (0.7 eV, N_T = 7 × 10¹⁵ cm⁻³) are found to be present on freshly prepared samples and their concentration remains unchanged after ageing.

中文翻译：

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深入了解有机光电探测器的故障机理

这项工作详细研究了聚（2,7-咔唑-alt-4，7-二噻吩基-2,1,3-苯并噻二唑）：苯基-C61-丁酸甲酯基有机光电二极管（OPDs）在可见光下的可靠性光线和空气暴露。的电流-电压（我- V）的状态的最先进的OPD调制的特性在室温和低温下测量两者之前，期间和老化后。尽管电极仅会受到老化的轻微影响，但无论是否缺少紫外线，活性层都会受到严重损坏，从而导致响应度大大降低。热激励电流与I – V特性与温度（I – V – T）的组合）技术以及广泛使用的漂移扩散模拟都表明，观察到的退化是浅陷阱（0.2 eV，N _T = 10 ¹⁶ cm ^-3）产生的结果，这些陷阱大大降低了电荷载流子的迁移率。相反，发现新鲜制备的样品上存在深陷阱（0.7 eV，N _T = 7×10 ¹⁵ cm ^-3），并且它们的浓度在老化后保持不变。