Pseudocapacitance sites emanating from co‐doping with nitrogen and phosphorous in hiearchical carbon are identified by using near‐edge X‐ray absorption fine structure (NEXAFS) spectroscopy. Associated space charge capacitance, characterized by using ultraviolet photoelectron spectroscopy (UPS), is induced by charging and enhances interfacial capacitance. Electrodes with high mass loading (8 mg cm⁻²) provide high energy density, and high stability is obtained (91.4 % retention after 10,000 cycles). We describe a two‐step synthetic procedure, relying on hard templating with nanosilica and pyrolyzing polyaniline in the presence of triphenylphosphine followed by silica etching and annealing in the presence of ammonia gas. This method yields hierarchical porous N−P co‐doped carbon (HP‐NPC).

中文翻译：

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碱性碳超级电容器中伪电容位的协同掺杂

通过使用近边缘X射线吸收精细结构（NEXAFS）光谱鉴定了分层碳中氮和磷的共掺杂引起的假容容位点。通过使用紫外线光电子能谱（UPS）来表征相关的空间电荷电容，并通过充电来增强界面电容。具有高质量负载（8 mg cm ^-2）的电极提供了高能量密度，并且获得了高稳定性（10,000次循环后91.4％的保留率）。我们描述了一个两步合成程序，该程序依赖于在三苯基膦存在下对纳米二氧化硅进行硬模板化并热解聚苯胺，然后在氨气存在下进行二氧化硅蚀刻和退火。该方法可产生分层的多孔N-P共掺杂碳（HP-NPC）。