We investigated the unusual layering transition (LT) in quasi-2D liquid silicon dioxide (SiO₂) confined in a nanoslit. Our results indicate that the slit size and pressure induce the abnormal LT in liquid SiO₂, accompanied by a rapid change in the density, diffusion coefficient, pair correlation function and average potential energy. The silicon and oxygen atoms are almost completely separated under the extremely strong confinement effect, which is the characteristic feature of the LT. The negative slope of the LT lines in the phase diagram at different pressures suggests that a confinement-induced LT occurs at high pressure and a pressure-induced LT occurs at low pressure.

中文翻译：

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纳米缝隙中二氧化硅的液体分层转变中硅-氧键的异常分离

我们研究了被限制在纳米缝隙中的准2D液态二氧化硅（SiO ₂）中的异常层化转变（LT）。我们的结果表明，狭缝的大小和压力会导致液态SiO _2中的LT异常，并伴随着密度，扩散系数，配对相关函数和平均势能的快速变化。硅和氧原子在极强的约束作用下几乎被完全分离，这是LT的特征。相图中LT线在不同压力下的负斜率表明，在高压下会发生限制诱发的LT，而在低压下会发生压力诱发的LT。