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Increased omnidirectional light absorbance by using hollow silica nanoparticles in an anti-reflective pattern for efficient organic photovoltaic devices
Organic Electronics ( IF 3.2 ) Pub Date : 2017-12-05 , DOI: 10.1016/j.orgel.2017.11.043
Woongsik Jang , Keum Hwan Park , Dong Hwan Wang

We investigated a single-layer low refractive index anti-reflection (AR) coating on an organic photovoltaic device, using hollow silica nanoparticles, as shown in a cross-sectional TEM image. The PCE (6.53%) of the device with the AR pattern layer was improved, which contributed to the increased light absorption in the broadband range and charge generation at normal incidence observed by optical and electrical analysis, respectively. Comparing the photovoltaic performance of the devices without and with the AR pattern layer by hollow silica nanoparticles, the AR pattern achieved an angle of incidence (AOI) improvement of averaged absorbance reduction of 45% and 74% for AOIs of 30 and 60°, compared to that of the bare substrate. Consequently, the AR pattern layer showed excellent broadband and omnidirectional AR properties, and improved the performance of the device at various AOIs. The AR pattern layer from silica nanoparticles can be a useful approach for reducing reflectance in solar devices by a simple coating process, which will contribute to higher performance of organic photovoltaic devices.



中文翻译:

通过在有效的有机光伏器件中使用抗反射图案的空心二氧化硅纳米粒子,可以提高全向吸光率

我们研究了使用空心二氧化硅纳米粒子的有机光伏器件上的单层低折射率减反射(AR)涂层,如横截面TEM图像所示。带有AR图案层的设备的PCE(6.53%)得到了改善,这分别有助于通过光学和电学分析观察到宽带范围内的光吸收增加和法向入射时的电荷产生。比较中空二氧化硅纳米粒子不带AR图案层和带有AR图案层的器件的光伏性能,与30和60°的AOI相比,AR图案实现了入射角(AOI)的改善,平均吸光度降低了45%和74%到裸露的基材。因此,增透膜图案层显示出出色的宽带和全向增透膜性能,并改善了在各种AOI上设备的性能。由二氧化硅纳米粒子制成的AR图案层可能是一种有用的方法,可通过简单的涂覆过程来降低太阳能设备中的反射率,这将有助于提高有机光伏设备的性能。

更新日期:2017-12-05
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