Electron energy loss spectroscopy (EELS) performed in a scanning transmission electron microscope (STEM) has demonstrated unprecedented power in the characterization of surface plasmons. The subangstrom spatial resolution achieved in EELS and its capability of exciting the full set of localized surface plasmon resonance (LSPR) modes supported by a metallic nanostructure makes STEM/EELS an ideal tool in the study of LSPRs. The plasmonic properties characterized using EELS can be associated with geometric or structural features collected simultaneously in a STEM to achieve a deeper understanding of the plasmonic response. In this review, we provide the reader a thorough experimental description of EELS as a LSPR characterization tool and summarize the exciting recent progress in the field of STEM/EELS plasmon characterization.

中文翻译：

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用电子能量损失谱探测纳米等离子。

在扫描透射电子显微镜（STEM）中进行的电子能量损失谱（EELS）在表征表面等离子体激元方面已显示出空前的实力。在EELS中实现的亚埃空间分辨率及其激发金属纳米结构支持的整套局部表面等离振子共振（LSPR）模式的能力使STEM / EELS成为研究LSPR的理想工具。使用EELS表征的等离子体特性可以与在STEM中同时收集的几何或结构特征相关联，以实现对等离子体响应的更深入了解。在这篇综述中，我们为读者提供了对EELS作为LSPR表征工具的详尽实验说明，并总结了STEM / EELS等离子体激元表征领域中令人振奋的最新进展。