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A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film
The Journal of Physical Chemistry B ( IF 3.3 ) Pub Date : 2017-11-09 00:00:00 , DOI: 10.1021/acs.jpcb.7b06975
G. M. Sacha 1 , A. Verdaguer 2 , M. Salmeron 3
Affiliation  

The dielectric properties of thin films can be modified relative to the bulk material because the interaction between film and substrate influences the mobility of the atoms or molecules in the first layers. Here we show that a strong scale effect occurs in nanometer size octadecylammine thin films. This effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized Thomas–Fermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film.

中文翻译:

与薄膜厚度无关的薄膜极化率表征模型

薄膜的介电特性可以相对于块状材料进行修改,因为薄膜和基板之间的相互作用会影响第一层中原子或分子的迁移率。在这里,我们表明,在纳米尺寸的十八胺薄膜中会发生强尺度效应。该效应归因于取决于膜尺寸的分子的不同分布。为了准确描述这种影响,我们开发了一个模型,该模型是对线性化Thomas-Fermi逼近的重新解释。在此模型中,我们已经能够表征薄膜的偏振性,而与薄膜的厚度无关。
更新日期:2017-11-09
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