Cu₂O is an attractive material in terms of semiconducting properties and is considered a leading candidate in all-oxide photovoltaics. Electrochemical analysis of Cu₂O, including Mott-Schottky (MS) and impedance spectroscopy (IS), provides a wealth of data on charge carriers, Fermi level and interface properties. MS and IS are usually measured in aqueous solutions. However, Cu₂O is easily reduced or oxidized to Cu or CuO in aqueous solutions, the layer peels off after the analysis and there is a small voltage window for the tests. In some cases, an anti-corrosive n-type barrier layer is employed on top of the bare Cu₂O electrode to make the measurement possible, which could result in deviation from actual values. Here we introduce a non-aqueous electrolyte based on tetrabutylammonium-tetrafluoroborate in 3-methoxypropionitrile for electrochemical analysis of Cu₂O. MS analysis shows reproducible results in terms of dopant density and flat band potential, while the analysis in aqueous (0.5 M Na₂SO₄) electrolyte shows inconsistent, irreproducible results. In the case of IS, the transport resistivity of the layers was evaluated using the new electrolyte and shows a linear trend with thickness, as expected. The proposed non-aqueous electrolyte can potentially be used for the electrochemical analysis of other sensitive semiconductors.

就半导体性能而言，Cu ₂ O是一种有吸引力的材料，并且被认为是全氧化物光伏领域的领先候选材料。Cu ₂ O的电化学分析，包括Mott-Schottky（MS）和阻抗谱（IS），可提供有关载流子，费米能级和界面特性的大量数据。MS和IS通常在水溶液中测量。但是，Cu ₂ O在水溶液中容易还原或氧化为Cu或CuO，分析后该层会剥落，并且测试的电压窗口较小。在某些情况下，可在裸露的Cu ₂顶部使用防腐蚀n型势垒层O电极使测量成为可能，这可能导致与实际值的偏差。在这里，我们介绍一种基于三丁基四氟硼酸四丁基铵在3-甲氧基丙腈中的非水电解质，用于Cu ₂ O的电化学分析。MS分析显示出掺杂剂密度和平坦带电势方面可重复的结果，而在水性（0.5 M Na ₂ SO ₄）电解质显示不一致，不可复制的结果。在IS的情况下，使用新的电解质评估了层的传输电阻率，并显示了随厚度变化的线性趋势。所提出的非水电解质可以潜在地用于其他敏感半导体的电化学分析。