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Effects of H2O- and O2-containing He carrier gases on the 206Pb/238U system bias and down-hole fractionation in LA-ICPMS of zircon
Journal of Analytical Atomic Spectrometry ( IF 3.4 ) Pub Date : 2017-09-06 00:00:00 , DOI: 10.1039/c7ja00017k
Steffen Allner 1, 2, 3, 4 , Joachim Koch 1, 2, 3, 4 , Simon E. Jackson 5, 6, 7 , Detlef Günther 1, 2, 3, 4
Affiliation  

This paper deals with the effects the addition of H2O or O2 to He aerosol carrier gas has on 206Pb/238U ratios during laser ablation inductively-coupled plasma mass spectrometry (LA-ICPMS) of natural zircon and synthetic silicate glass. The following parameters were studied: (i) system bias defined as constant but LA-ICPMS system-dependent shifts in 206Pb/238U ratios, (ii) down-hole fractionation given by the slope of the 206Pb/238U ratio vs. LA time, and (iii) the sum of (i) and (ii) referred to as the overall elemental fractionation. To isolate and study changes of 206Pb/238U ratios arising independently from either LA sampling or ICPMS analysis of the generated aerosols, a diffusion-based gas exchange device was used. The supply of He + O2 caused relative changes in mean 206Pb/238U values and temporal gradients due to the LA process of less than 40%. By contrast, addition of H2O to the He carrier gas changed 206Pb/238U ratios by up to 150% through processes occurring during LA as well as ICPMS analysis. Here, the opposing temporal gradients of 206Pb/238U ratios canceled out at relative humidity levels close to the saturation vapor pressure under ambient lab conditions, i.e., 20 °C room temperature. As a consequence, changes in 206Pb/238U ratios caused by down-hole fractionation could be suppressed. However, the admixture of H2O also affected the system bias at the same time, resulting in increased offsets in 206Pb/238U ratios such that the accuracy of LA-ICPMS analyses worsened by up to 6% when applied to the age determination of zircon. Neither worsening nor significant improvements in the accuracy of 206Pb/238U ages were observed in the case of LA-ICPMS using He + O2 carrier gas mixtures.

中文翻译:

含H 2 O和O 2的He载气对锆石LA-ICPMS中206 Pb / 238 U系统偏压和井下分馏的影响

本文研究了在天然锆石和合成硅酸盐玻璃的激光烧蚀电感耦合等离子体质谱法(LA-ICPMS)中,向He气溶胶载气中添加H 2 O或O 2206 Pb / 238 U比的影响。研究了以下参数:(i)系统偏差定义为206 Pb / 238 U比值恒定但与LA-ICPMS相关的系统位移;(ii)206 Pb / 238 U比值的斜率给出的井下馏分与。 LA时间,和(iii)的总和(ⅰ)和(ii)被称为整体元素分馏。为了隔离和研究独立于LA采样或生成气溶胶的ICPMS分析而引起的206 Pb / 238 U比值的变化,使用了基于扩散的气体交换设备。He + O 2的供给导致平均206 Pb / 238 U值和时间梯度的相对变化,这是因为LA过程的变化小于40%。相比之下,通过在LA期间发生的过程以及ICPMS分析,向He载气中添加H 2 O最多可将206 Pb / 238 U的比率改变150%。在这里,相对的时间梯度为206 Pb / 238在环境实验室条件(室温20°C)下,相对湿度水平接近饱和蒸气压时,U比率被抵消。结果,可以抑制由于井下分级而引起的206 Pb / 238 U比的变化。但是,H 2 O的混合物同时也影响系统偏差,导致206 Pb / 238 U比值的偏移增加,因此,将LA-ICPMS分析的准确性应用于年龄确定时,精度降低了6%。锆石 在使用He + O的LA-ICPMS的情况下,未观察到206 Pb / 238 U年龄准确性的恶化或显着提高。2种载气混合物。
更新日期:2017-11-02
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