The growing release of technology-critical elements (TCEs): Ga, Ge, In, Nb, Ta, Te, Tl, and most of the platinum group elements (PGEs), and rare earth elements (REEs) requires the understanding of their mobility, reactivity and chemical transformations in the environment which are critically dependent on their chemical form (speciation). The total concentrations of these elements at the trace levels make their speciation analysis challenging. Coupled techniques combining a high resolution chromatographic separation with ultrasensitive element-specific detection by inductively coupled plasma mass spectrometry (ICP MS) often offer the unique possibility of accessing the information on the identities and concentrations of individual metal species present in environmental samples. This paper reviews the advantages and limitations of these techniques to TCEs speciation and highlights the development trends in analytical methodology that may contribute to our understanding of the risks associated with the increasing environmental presence of TCEs.

诸如Ga，Ge，In，Nb，Ta，Te，Tl和大多数铂族元素（PGE）和稀土元素（REE）等技术关键元素（TCE）的释放日趋增长，这需要对其迁移率有所了解，反应性和环境中的化学转化主要取决于其化学形式（形态）。这些元素在痕量水平上的总浓度使其形态分析具有挑战性。耦合技术将高分辨率色谱分离与通过电感耦合等离子体质谱法（ICP MS）进行的超灵敏元素特异性检测相结​​合，通常提供访问环境样品中单个金属物种的身份和浓度信息的独特可能性。