Super-resolved structured illumination microscopy (SR-SIM) is among the most rapidly growing fluorescence microscopy techniques that can surpass the optical diffraction limit. The strength of SR-SIM is that it can be readily applied to samples prepared for conventional fluorescence microscopy, requiring no sophisticated sample preparation protocols. As an extension of wide-field fluorescence microscopy, it is inherently capable of multicolor imaging and optical sectioning and, with sufficiently fast implementations, permits live cell imaging. Image reconstruction, however, currently relies on sophisticated computational procedures, susceptible to reconstruction artifacts, requiring trained users to recognize and avoid them. Here, we review the latest developments in SR-SIM research. Starting from a historical overview of the development of SR-SIM, we review how this method can be implemented in various experimental schemes, we provide an overview of the important parameters involved in successful image reconstruction, we summarize recent biological applications, and we provide a brief outlook of the directions in which we believe SR-SIM is headed in the future.

中文翻译：

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超分辨率结构照明显微镜

超分辨结构照明显微镜（SR-SIM）是发展最快的荧光显微镜技术之一，可以超过光学衍射极限。SR-SIM的优势在于可以轻松应用于常规荧光显微镜制备的样品，而无需复杂的样品制备方案。作为宽视场荧光显微镜的扩展，它固有地能够进行多色成像和光学切片，并且以足够快的实施方式，可以进行活细胞成像。然而，图像重建当前依赖于复杂的计算过程，容易受到重建伪像的影响，需要训练有素的用户来识别和避免它们。在这里，我们回顾了SR-SIM研究的最新进展。从SR-SIM开发的历史回顾开始，