Abstract A robust methodology is presented to extract slip system strengths from lattice strain distributions for polycrystalline samples obtained from high-energy x-ray diffraction (HEXD) experiments with in situ loading. The methodology consists of matching the evolution of coefficients of a harmonic expansion of the distributions from simulation to the coefficients derived from measurements. Simulation results are generated via finite element simulations of virtual polycrystals that are subjected to the loading history applied in the HEXD experiments. Advantages of the methodology include: (1) its ability to utilize extensive data sets generated by HEXD experiments; (2) its ability to capture trends in distributions that may be noisy (both measured and simulated); and (3) its sensitivity to the ratios of the family strengths. The approach is used to evaluate the slip system strengths of Ti-6Al-4V using samples having relatively equiaxed grains. These strength estimates are compared to values in the literature.

中文翻译：

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使用晶格应变分布的谐波分析确定 HCP 滑动系统的强度

摘要 提出了一种稳健的方法，可从原位加载的高能 X 射线衍射 (HEXD) 实验中获得的多晶样品的晶格应变分布中提取滑移系统强度。该方法包括将来自模拟的分布的谐波展开系数的演变与从测量得出的系数相匹配。模拟结果是通过虚拟多晶的有限元模拟生成的，这些虚拟多晶经受了 HEXD 实验中应用的加载历史。该方法的优点包括：（1）能够利用由 HEXD 实验生成的大量数据集；(2) 它能够捕捉可能有噪声的分布趋势（测量的和模拟的）；(3) 对家庭实力比值的敏感性。该方法用于使用具有相对等轴晶粒的样品评估 Ti-6Al-4V 的滑移系统强度。这些强度估计值与文献中的值进行了比较。