Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold-drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the <111> texture was changed into the <001> one in the CPACs annealed at a temperature of 90 °C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 °C to 300 °C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.

在电子传输过程中强度下降始终是架空传输线的隐患。在这项研究中，通过一系列退火实验，系统地研究了冷拉市售纯铝导体（CPAC）的组织演变和强度退化行为。结果表明，在重结晶过程中，织构的演化，位错的恢复和亚晶粒的生长应是造成CPAC强度下降的原因。此外，组织的演变取决于退火温度。例如，在90°C退火的CPAC中，某些<111>织构变成了<001>织构；而在150°C至300°C的高温范围内对CPAC进行退火时，亚晶粒宽度明显增加。