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Random Access Memory: Organic Ferroelectric‐Based 1T1T Random Access Memory Cell Employing a Common Dielectric Layer Overcoming the Half‐Selection Problem (Adv. Mater. 34/2017)
Advanced Materials ( IF 29.4 ) Pub Date : 2017-09-07 , DOI: 10.1002/adma.201770246
Qiang Zhao 1, 2 , Hanlin Wang 1, 2 , Zhenjie Ni 1 , Jie Liu 3 , Yonggang Zhen 1 , Xiaotao Zhang 3 , Lang Jiang 1 , Rongjin Li 3 , Huanli Dong 1 , Wenping Hu 1, 3
Affiliation  

Organic ferroelectric random access memory (FeRAM) shows the advantages of durable data storage and nondestructive readout as nonvolatile memory in flexible electronics. In article number 1701907, Lang Jiang, Wenping Hu, and co‐workers present a novel FeRAM cell with one selection transistor and one ferroelectric memory transistor (1T1T) sharing a common dielectric, making multiple dielectric handling unnecessary and simplifying 1T1T memory fabrication. This technique offers wide prospects for half‐selection problem‐free, flexible memory cell arrays.
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中文翻译:

随机存取存储器:采用有机介电层的基于有机铁电的1T1T随机存取存储器单元克服了半选问题(Adv。Mater。34/2017)

有机铁电随机存取存储器(FeRAM)具有持久的数据存储和无损读出的优点,可作为柔性电子产品中的非易失性存储器。在1701907号文章中,江郎,胡文平和同事们提出了一种新型FeRAM单元,该单元具有一个选择晶体管和一个铁电存储晶体管(1T1T),它们共享一个公共电介质,从而不需要多个电介质处理,并简化了1T1T存储器的制造。该技术为半选择无问题的灵活存储单元阵列提供了广阔的前景。
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更新日期:2017-09-07
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