Hetero‐nanostructured films are essential for developing applications in a number of areas, such as flexible electronics and nanophotonics. In article number 1700073, Bert Müller and co‐workers describe the use of spectroscopic ellipsometry to monitor film formation in real time, with sub‐nanometer resolution. Their data show not only the plasmonic fingerprints of a number of hetro‐nanostructures, but also show how their optical properties evolve during deposition.

中文翻译：

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纳米结构的形成：时间分辨等离子体用于在线监测低压介电弹性体传感器的金属/弹性体沉积（Adv。Electron。Mater。8/2017）

异质纳米结构薄膜对于许多领域的开发应用至关重要，例如柔性电子学和纳米光子学。BertMüller及其同事在1700073号文章中描述了使用分光椭偏仪实时监测亚纳米分辨率下的成膜情况。他们的数据不仅显示了许多异质纳米结构的等离子指纹，还显示了它们在沉积过程中光学特性如何演化。