High-throughput methods were used to investigate a Ni–Co–Al thin film materials library, which is of interest for structural and functional applications (superalloys, shape memory alloys). X-ray diffraction (XRD) measurements were performed to identify the phase regions of the Ni–Co–Al system in its state after annealing at 600 °C. Optical, electrical, and magneto-optical measurements were performed to map functional properties and confirm XRD results. All results and literature data were used to propose a ternary thin film phase diagram of the Ni–Co–Al thin film system.

中文翻译：

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薄膜材料系统Ni-Co-Al的高通量结构和功能表征

高通量方法用于研究Ni-Co-Al薄膜材料库，这对于结构和功能应用（超级合金，形状记忆合金）很重要。在600°C退火后，进行了X射线衍射（XRD）测量以鉴定Ni-Co-Al系统状态下的相区。进行了光学，电学和磁光测量，以绘制功能特性图并确认XRD结果。所有的结果和文献资料都被用来提出Ni-Co-Al薄膜系统的三元薄膜相图。